1 (a)
Define DFD and also draw the data flow graph of following code.
int binsearch (int x, int v [], intn)
{
int low, high, mid;
low=0;
high=n-1;
while (low?high)
{
Mid=(low+high)/2;
If(x high=mid-1;
else
if(x>v[mid])
low=mid+1;
else
return mid;
}
Return-1;
}
int binsearch (int x, int v [], intn)
{
int low, high, mid;
low=0;
high=n-1;
while (low?high)
{
Mid=(low+high)/2;
If(x
else
if(x>v[mid])
low=mid+1;
else
return mid;
}
Return-1;
}
10 M
1 (b)
Explain McCall's quality factors and criteria.
10 M
2 (a)
Differentiate the following.
(1) Black box & White box testing.
(2) Verification & validation.
(1) Black box & White box testing.
(2) Verification & validation.
10 M
2 (b)
Explain the following terms with example
(i) failure (ii) error (iii) fault (iv) defect (v) verification
(i) failure (ii) error (iii) fault (iv) defect (v) verification
10 M
3 (a)
Explain boundary value analysis with the help of an example.
10 M
3 (b)
What is a test oracle? What are the differences between parametric oracle & statistical oracle?
10 M
4 (a)
Explain with suitable example the concept of mutation testing, mutant, mutation score, killable mutant & staburn mutant. What do you mean by equivalent mutant?
10 M
4 (b)
Differentiate static and dynamic unit testing also explain steps in the code reviews process.
10 M
5 (a)
What are the objectives of acceptance testing? What is the difference between UAT and BAT?
10 M
5 (b)
What is system Integration testing and what are common approaches to perform system integration.
10 M
6 (a)
Explain test execution strategy in details.
10 M
6 (b)
Explain different metrics used in system testing.
10 M
7 (a)
Explain different views of software quality.
5 M
7 (b)
Explain load testing & stress testing
5 M
7 (c)
Explain defect life cycle.
5 M
7 (d)
What are zero day attacks? Discuss it's significance with respect to security testing.
5 M
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