Total marks: --
Total time: --
INSTRUCTIONS
(1) Assume appropriate data and state your reasons
(2) Marks are given to the right of every question
(3) Draw neat diagrams wherever necessary


1 (a) Discuss the NMOS enhancement mode transistor for different conditions of vds.
6 M
1 (b) Elaborate the concept of P-well fabrication with neat sketches.
10 M
1 (c) Compare CMOS and bipolar technologies.
4 M

2 (a) Obtain the transfer characteristics of a CMOS inverter and mark all the regions, showing the status of PMOS and NMOS transistors.
10 M
2 (b) Illustrate the schematic and stick diagram for the expression Y=A(B+C).
10 M

3 (a) Discuss in detail the λ based design for CMOS.
10 M
3 (b) Realize a 3 input NAND gate for clocked CMOS logic and also for CMOS domino logic.
6 M
3 (c) Discuss the working of pseudo NMOS logic with suitable example.
4 M

4 (a) Describe the delay unit τ in terms of sheet resistance and area capacitance for the CMOS inverter pain shown, calculate the total delay.

8 M
4 (b) Explain in brief the wiring capacitance.
6 M
4 (c) Narrate the steps involved in calculate the sheet resistance of
i) Transistor channel
ii) nMOS inverter
iii) CMOS inverter.
6 M

5 (a) What are the scaling factors for the following device parameters.
i) Gate capacitance cg ii) max-operating frequency f0 iii) current density iv) power dissipation per gate pg v) power speed product PT.
10 M
5 (b) Design a parity generator with the following specifications and draw the stick diagram of one basic cell.

10 M

6 (a) Draw the basic form of two-phase clock generator and explain in detail.
8 M
6 (b) Discuss the architectural issues to be followed in the design of a VLSI subsystem.
6 M
6 (c) Explain the pre-charge bus approach used in system design.
6 M

7 (a) Explain the three transistor dynamic RAM cell.
10 M
7 (b) Discuss the Bangh-Wooley method used for two's complement multiplication.
10 M

8 (a) Narrate the meaning of 'Real Estate' in VLSI design.
5 M
8 (b) Explain testing and testability in detail.
10 M
8 (c) Write a short note on scan design techniques.
5 M



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